Nikon Specification: * High-resolution metrology for wafer inspection and measurement * Advanced optics and sensor technology for accurate results * Compatible with a variety of wafer sizes and materials * Easy-to-use software for seamless integration into production workflows Our Nikon Metrology Wafer Processing System is designed to provide high-accuracy measurement and inspection of wafers in the semiconductor industry. With advanced optics and sensor technology, this system ensures reliable and precise results, and is easy to use and integrate into your production workflow. Whether you're working with small or large wafers, our system is compatible with a variety of materials and sizes, making it a versatile solution for your metrology needs.